The native mesh resolution is improved from import to visualisation. The optional Slideshow tab (additional licence required), can display multiple slides of dimensional and informational labels whenever users execute a measurement routine.
Inspect software was first introduced with PC-DMIS 2017 R1 in January 2017 as a simple front-end for PC-DMIS Measurement Routines. PC-DMIS 2017 R2 introduces Slideshow for Inspect software, allowing users to create unlimited customisable layouts with inspection results populated during measurement. This is the second of two major releases scheduled for PC-DMIS in 2017, with continued service pack updates to ensure maximum reliability of the platform. According to the invention, this pattern comprises a plurality of nanometric structures (14), said nanometric structures (14) having one and the same section in the plane of said surface and having the same nanometric dimensions, in particular less than 50 nm, said nanometric structures (14) being arranged at a distance from one another by a constant pitch of nanometric length, in particular less than 50 nm, in at least one direction, said nanometric structures (14) being arranged within spatial regions (12) delimited in one or more directions in the plane of the substrate (10), said nanometric structures (14) being obtained via application to said substrate (10) of a process of nanostructuring (100) by means of a mask of block copolymers in order to make calibrations of measurements of length of the order of nanometres.Hexagon Manufacturing Intelligence has launched PC-DMIS 2017 R2, the latest edition of the measurement software. Abstract: A reference-standard device (20) for calibration of measurements of length, comprising a substrate (10) that includes a surface (10a) having at least one calibration pattern (11).
0 kommentar(er)
